Carbon Nanotube Probe for AFM


Carbon Nanotube Probe for AFM


This is the probe for the atomic force microscope using the carbon
nanotube a cantilever,which is the thinnest of all the substances.


Typical Features

 It has high resolution.Small curvature at the head end.
 The head end has highly durability for breakage and abrasion, and provides high data repeatability.